Secondary electron yield characterization of high porosity surfaces for multipactor-free microwave components

We present secondary electron yield (SEY) characterization of high porosity surfaces for multipactor-free microwave components. first calculate the SEYs through using Monte Carlo simulations. demonstrate that these can be treated as homogeneous materials with low effective SEYs. prove a significant SEY reduction is attainable by porosities, and above certain level, entire surface falls below unity, offering multipactor free capability. import resultant into our semi-analytic approach to obtain susceptibility charts corresponding different porosities. predict multipactor-susceptible zone increases total suppression 0.66 level. The theoretical results were validated experiments, relatively good agreement was observed. Finally, we propose an alternative blind offer same capabilities. discussed herein adopted design high-power